Showing results: 91 - 105 of 132 items found.
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Cath-X -
Glenbrook Technologies
The Cath-X is a bench top system employing Glenbrook’s micro-fluoroscopy technology providing highly detailed x-ray video of the critical components of the needle device. The transparent, safely shielded, view chamber permits the operator to locate the critical areas of the needle for inspection. The x-ray image can be further magnified using the electro-optical zoom feature of the Cath-X.
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X-CARD ME -
Detection Technology Inc.
X-Card ME3 is a stand-alone multi-energy detector board designed for linear X-ray imaging systems. It powers a variety of security and industrial applications that require state-of-the-art material discrimination capability yet cost-effective architectures in comparison with multi-view and CT systems. For example, it is an ideal solution for meeting the requirements of the EDS CBS C2 standard, making it possible to keep laptops and other personal electronics in the hand luggage during the scan.
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XPERT 40 -
Kubtec
Whether in the biopsy suite or the pathology lab, nothing beats the XPERT 40 Specimen Radiography System in terms of versatility and speed. A 50kV, 1.0 mA X-ray penetrates the densest cores and surgical specimens, identifying the finest details in seconds.
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Fraunhofer-Gesellschaft
The key area of expertise and the basis for all developments at the Fraunhofer IOF is optical and mechanical design as well as the simulation and analysis of optical and opto-mechanical systems inclusive of thermal and thermo-optical effects. Extensive design and modeling tools enable the simulation and optimization of systems for the THz to X-ray range - from micro-optics to astronomical telescopes.
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X-eye NF120 -
SEC Co., Ltd.
Nano-focus Tube of 400 nano resolution is installed which is specialized for Semiconductor Packaging, Wafer Level Packaging(WLP) requiring detection of Sub-micron defects.Able to trace and inspect defected area precisely by precise movement of axis with Anti-vibration table.Tomography is available if 3D CT module is added and Wafer Bump Automatic Inspection is available from loading to inspection with wafer handler systems.
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Aspect -
Onto Innovation
Memory density increases with both layer-pair scaling and tier stacking for memory stacks well over 200 pairs. The Aspect metrology system was designed with these future architectures and scaling strategies in mind. Aspect metrology is demonstrating performance superior to X-ray systems across multiple customer devices through a revolutionary infrared optical system providing full profiling capability to enable critical etch and deposition control, with the speed and process coverage that customers require.
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XT V 160R -
Nikon Metrology, Inc.
The XT V 160R is a versatile microfocus X-ray system for both manual and programmed inspection of electronics, semiconductor or small industrial samples.
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Baltic Scientific Instruments, Ltd
X-ray spectrometers based on Si detectors with liquid nitrogen cooling, Peltier and electric machine cooling. The spectrometers are applied in the various systems for element analysis: X-ray fluorescent; electron probe; with alpha and beta excitation etc, as well as for the precision diffractometry in the devices of structural and phase analysis.
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Sydor Technologies
Photek photon-counting camera systems are unique as they provide the ability to capture and integrate an image in real time. These systems are ideal for extremely low photon emission applications such as bio-luminescence, chemi-luminescence and weak fluorescence. The ability to accurately analyze transient events is a key feature of this product. The length of time that the image can be integrated is limited only by disc space, and allows the user to fully capture real-time events. X, Y and time co-ordinates for post acquisition analysis is also recorded. X-ray and vacuum imaging camera options are also available.
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X'Pert³ -
Malvern Panalytical Ltd
The successful X'Pert platform is continued by the Malvern Panalytical’s X'Pert³ range of X-ray diffraction systems. With new on-board control electronics, compliance with the latest and most stringent X-ray and motion safety norms, advances in eco-friendliness and reliability the X'Pert³ platform is ready for the future.
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FlexXray
FlexXray has developed leading, certified technology and processes to use advanced x-ray technology to inspect products specifically for food companies. Although they look like a TSA line at the airport, our systems are highly customized machines and processes built specifically to find contaminants like metal, glass, wood, stone, plastic, and rubber in food products of all types. What we do is find needles in haystacks – but the needles we find are even smaller than needles in a haystack. In fact, FlexXray can find contaminants down to 0.8mm or smaller.
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Nikon Instruments Inc.
Systems offer a microfocus X-ray source, a large inspection volume, high image resolution and is ready for ultrafast CT reconstruction. They cover a wide range of applications, including the inspection of plastic parts, small castings and complex mechanisms as well as researching materials and natural specimens.
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FAST ComTec GmbH
The XR-100CR is a new high performance x-ray detector, preamplifier, and cooler system using a thermoelectrically cooled Si-PIN photodiode as an xray detector. Also mounted on the 2-stage cooler are the input FET and a novel feedback circuit. These components are kept at approximately -55 °C, and are monitored by an internal temperature sensor. The hermetic TO-8 package of the detector has a light tight, vacuum tight thin Beryllium window to enable soft xray detection. The XR-100T-CdTe represents a breakthrough in xray detector technology by providing “off-the-shelf” performance previously available only from expensive cryogenically cooled systems. The XR-100-CdTe is also suited for measuring gamma rays.
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FISCHERSCOPE X-RAY 5000 -
Helmut Fischer AG
Flange measuring head for continuous measurements in production linesProportional counter tube, peltier-cooled silicon PIN diode or silicon drift detector as X-ray detectorQuick and easy calibration on a workpiece master directly in the production processFor use in air or vacuumAllows measurements even on very hot substrate materials up to 500 C (930 F)Design is focused on maximum robustness and serviceability
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RTX-113HV -
Glenbrook Technologies
A high performance real-time X-ray inspection system designed for inspection of multi-layer, assembled printed circuit boards, with dense metal BGAs, and recommended for lead free inspection requirements. Our RTX-113HV system meets all your needs for inspecting BGA packages.
